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The primary goal of our research is to understand the structure-property relationship in advanced materials, for which we utilize several advanced TEM-related techniques including atomic-resolution STEM/EELS, CBED, electron holography or in-situ electrical biasing experiment. Furthermore, we try to correlate atomic and electronic structures of advanced materials with their physical properties using DFT calculations.
Our group members are trained to be experts in the characterization of advanced materials. We believe that our research further leads to design functional materials or devices of new concept.
Electron Microscopy & Spectroscopy Laboratory
College of Engieneering, Seoul National University
1 Gwanak-ro, Gwanak-gu, Seoul 151-742, Republic of Korea
(151-742) 서울특별시 관악구 관악로 1 서울대학교 공과대학 재료공학부 30동 517호
Tel: +82-2-880-9316, Fax: +82-2-884-1413
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