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Miyoung Kim

Professor

Miyoung Kim

김미영

(+82)02-880-9239
mkim@snu.ac.kr
Academic Experiences

• 1990 : B.S. Department of Physics, Seoul National University
• 1992 : M.S. Department of Physics, Seoul National University
• 1998 : Ph.D. Department of Physics, Arizona State University

• 1998-2001 : Post Doctoral Researcher, Solid state division, Oak Ridge National Laboratory
• 2001-2004  : Senior Researcher, AE-Center, Samsung Advanced Institute of Technology
• 2004-2009  : Assistant Professor. Department of Materials Science and Engineering, Seoul National University
• 2009-2013  : Associate Professor. Department of Materials Science and Engineering, Seoul National University
• 2013 –  : Professor. Department of Materials Science and Engineering, Seoul National University

Research Interests

• Crystal Structure

– Analyzing crystal structure through (scanning) transmission electron microscopy((S)TEM), convergent beam electron diffraction(CBED) and nano-area electron diffraction(NED).
– Atomic structure of materials and interface, grain boundary, defect structure.

• Electronic Structure

– Analyzing electronic structure of the materials through electron energy loss spectroscopy(EELS) and density functional theory(DFT) calculation.
– Electronic structure of interface, grain boundary and defects.

• Nano scale measurement of charge distribution and stress

– Stress measurement, with 10nm resolution and 0.05% accuracy, of nano-structure’s domain.
– Measuring stress variance with respect to its position in semiconductor device, Stress measurement in multi layered nano thin film.

• In-situ I-V measurement in TEM

– I-V measurement in TEM with in-situ scanning tunneling microscopy(STM)/TEM double tilt holder.
– Direct measurement of local conductivity in nanomaterials, interface, grain boundary, and defect.

Selected Publications

– Direct observation of d-orbital holes and Cu-Cu bonding in Cu2O, Nature, 401,49 (1999)

– High-frequency micromechanical resonators from aluminium-carbon nanotube nanolaminates, Nat. Mater., 7, 457 (2008)

– Electron energy-loss spectroscopy analysis of HfO2 dielectric films on strained and relaxed SiGe/Si substrates, Appl. Phys. Lett., 92, 232906 (2008)

– Atomic structure of conducting nanofilaments in TiO2 resistive switching memory, Nat. Nanotechnol., 5, 148 (2010)

– Nearly single-crystalline GaN light-emitting diodes on amorphous glass substrates, Nat. Photonics, 5, 763 (2011)