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“Atomic-Scale Insights into the 2D Materials from Aberration-Corrected Scanning Transmission Electron Microscopy: Progress and Future”

“Atomic-Scale Insights into the 2D Materials from Aberration-Corrected Scanning Transmission Electron Microscopy: Progress and Future”

저자

Woonbae Sohn, Miyoung Kim, Ho Won Jang

저널 정보

출간연도

Small Sci. 2300073 (2024)