Home “Preferred diffusion paths for copper electromigration by in situ transmission electron microscopy”
저자
Young-Hwa Oh, Sung-Il Kim, Miyoung Kim, Seung-Yong Lee*, Young-Woon Kim*
저널 정보
출간연도
Ultramicroscopy, 2017, 181, 160-164 (2017.5)
링크
https://doi.org/10.1016/j.ultramic.2017.05.018
